Struct rp2040_pac::VREG_AND_CHIP_RESET
source · pub struct VREG_AND_CHIP_RESET { /* private fields */ }
Expand description
control and status for on-chip voltage regulator and chip level reset subsystem
Implementations§
source§impl VREG_AND_CHIP_RESET
impl VREG_AND_CHIP_RESET
sourcepub const PTR: *const RegisterBlock = {0x40064000 as *const vreg_and_chip_reset::RegisterBlock}
pub const PTR: *const RegisterBlock = {0x40064000 as *const vreg_and_chip_reset::RegisterBlock}
Pointer to the register block
sourcepub const fn ptr() -> *const RegisterBlock
pub const fn ptr() -> *const RegisterBlock
Return the pointer to the register block
sourcepub unsafe fn steal() -> Self
pub unsafe fn steal() -> Self
Steal an instance of this peripheral
§Safety
Ensure that the new instance of the peripheral cannot be used in a way that may race with any existing instances, for example by only accessing read-only or write-only registers, or by consuming the original peripheral and using critical sections to coordinate access between multiple new instances.
Additionally, other software such as HALs may rely on only one peripheral instance existing to ensure memory safety; ensure no stolen instances are passed to such software.
Methods from Deref<Target = RegisterBlock>§
sourcepub fn chip_reset(&self) -> &CHIP_RESET
pub fn chip_reset(&self) -> &CHIP_RESET
0x08 - Chip reset control and status
Trait Implementations§
source§impl Debug for VREG_AND_CHIP_RESET
impl Debug for VREG_AND_CHIP_RESET
source§impl Deref for VREG_AND_CHIP_RESET
impl Deref for VREG_AND_CHIP_RESET
impl Send for VREG_AND_CHIP_RESET
Auto Trait Implementations§
impl Freeze for VREG_AND_CHIP_RESET
impl RefUnwindSafe for VREG_AND_CHIP_RESET
impl !Sync for VREG_AND_CHIP_RESET
impl Unpin for VREG_AND_CHIP_RESET
impl UnwindSafe for VREG_AND_CHIP_RESET
Blanket Implementations§
source§impl<T> BorrowMut<T> for Twhere
T: ?Sized,
impl<T> BorrowMut<T> for Twhere
T: ?Sized,
source§fn borrow_mut(&mut self) -> &mut T
fn borrow_mut(&mut self) -> &mut T
Mutably borrows from an owned value. Read more